DocumentCode :
3018281
Title :
Test Data Compression with Partial LFSR-Reseeding
Author :
Fu, Yu-Hsuan ; Wang, Sying-Jyan
Author_Institution :
National Chung-Hsing University, Taichung, Taiwan
fYear :
2005
fDate :
18-21 Dec. 2005
Firstpage :
343
Lastpage :
347
Abstract :
The large amount of test data becomes a serious problem in SOC testing. In this paper, we propose a method to improve the LFSR reseeding based compression scheme. This method rearranges a given set of test data by merging and partitioning test cubes so that they can be decompressed with a fixed-length LFSR. The compression is done by eliminating repeated patterns in consecutive seeds. A singlepolynomial LFSR is used, so that the decompression process is simple and fast. Besides, it does not need an on-chip decoder. The compression method is very efficient, as experimental results show that it reduces 23.6% of stored data and 34.8% of transferred data compared with the previous methods.
Keywords :
Channel capacity; Circuit testing; Computer science; Decoding; Equations; Hardware; Merging; Test data compression; Vectors; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2481-8
Type :
conf
DOI :
10.1109/ATS.2005.105
Filename :
1575453
Link To Document :
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