DocumentCode :
3018349
Title :
Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor
Author :
Han, Yinhe ; Li, Xiaowei ; Swaminathan, Shivakumar ; Hu, Yu ; Chandra, Anshuman
Author_Institution :
Computing Technology, Chinese Academy of Sciences, Beijing, China
fYear :
2005
fDate :
18-21 Dec. 2005
Firstpage :
372
Lastpage :
377
Abstract :
This paper presents a decompression architecture using a periodically alterable MUXs decompressor for scan data volume reduction. Compared to static XOR network, the periodically alterable MUXs decompressor has multiple configurations to decode the input information more efficiently. Three different DFT techniques are proposed to handle hard, firm and soft cores, respectively. With the proposed pattern decompression algorithms and scan decompression architecture, smaller test data volume and test application time can be achieved as compared to previous techniques.
Keywords :
Circuit testing; Compaction; Computer architecture; Decoding; Feeds; Genetic mutations; Integrated circuit testing; Intellectual property; Microelectronics; Ring generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2481-8
Type :
conf
DOI :
10.1109/ATS.2005.96
Filename :
1575458
Link To Document :
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