• DocumentCode
    3018403
  • Title

    Synthesis of Testable Finite State Machine Through Decomposition

  • Author

    Sikdar, Biplab K. ; Sarkar, Arijit ; Roy, S. ; Das, Debesh K.

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Bengal Eng. & Sci. Univ., Howrah
  • fYear
    2005
  • fDate
    21-21 Dec. 2005
  • Firstpage
    398
  • Lastpage
    403
  • Abstract
    This paper reports an efficient state encoding scheme for synthesis of large FSMs with enhanced BIST quality. A metric, referred to as degree-of-freedom (DOF) (Roy et al., 2002) in FSM states has been employed to quantify the BIST quality. Analysis of DOF enables efficient encoding of FSM states and gives solution to the problem of handling unreachable/hard-to-exit/hard-to-reach state codes of an FSM. The synthesis of a large FSM is realized through decomposition. DOF analysis for the individual component sub-FSM states is done to reduce the complexity of synthesis. A scheme is proposed for encoding the sub-FSM states that significantly improves testability of the synthesized resultant FSM, displaying the terminal behavior as the original FSM
  • Keywords
    built-in self test; encoding; finite state machines; BIST quality; built-in self-test; degree-of-freedom; handling unreachable state codes; hard-to-exit state codes; hard-to-reach state codes; state encoding scheme; testable finite state machine; Automata; Testing; FSM state encoding; decomposition.; degree-of-freedom; emitability; reachability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. Proceedings. 14th Asian
  • Conference_Location
    Calcutta
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2481-8
  • Type

    conf

  • DOI
    10.1109/ATS.2005.102
  • Filename
    1575462