DocumentCode
3018403
Title
Synthesis of Testable Finite State Machine Through Decomposition
Author
Sikdar, Biplab K. ; Sarkar, Arijit ; Roy, S. ; Das, Debesh K.
Author_Institution
Dept. of Comput. Sci. & Technol., Bengal Eng. & Sci. Univ., Howrah
fYear
2005
fDate
21-21 Dec. 2005
Firstpage
398
Lastpage
403
Abstract
This paper reports an efficient state encoding scheme for synthesis of large FSMs with enhanced BIST quality. A metric, referred to as degree-of-freedom (DOF) (Roy et al., 2002) in FSM states has been employed to quantify the BIST quality. Analysis of DOF enables efficient encoding of FSM states and gives solution to the problem of handling unreachable/hard-to-exit/hard-to-reach state codes of an FSM. The synthesis of a large FSM is realized through decomposition. DOF analysis for the individual component sub-FSM states is done to reduce the complexity of synthesis. A scheme is proposed for encoding the sub-FSM states that significantly improves testability of the synthesized resultant FSM, displaying the terminal behavior as the original FSM
Keywords
built-in self test; encoding; finite state machines; BIST quality; built-in self-test; degree-of-freedom; handling unreachable state codes; hard-to-exit state codes; hard-to-reach state codes; state encoding scheme; testable finite state machine; Automata; Testing; FSM state encoding; decomposition.; degree-of-freedom; emitability; reachability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. Proceedings. 14th Asian
Conference_Location
Calcutta
ISSN
1081-7735
Print_ISBN
0-7695-2481-8
Type
conf
DOI
10.1109/ATS.2005.102
Filename
1575462
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