• DocumentCode
    3018475
  • Title

    Global Optimization for Shape Fitting

  • Author

    Lempitsky, Victor ; Boykov, Yuri

  • Author_Institution
    Moscow State Univ., Moscow
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We propose a global optimization framework for 3D shape reconstruction from sparse noisy 3D measurements frequently encountered in range scanning, sparse feature-based stereo, and shape-from-X. In contrast to earlier local or banded optimization methods for shape fitting, we compute global optimum in the whole volume removing dependence on initial guess and sensitivity to numerous local minima. Our global method is based on two main ideas. First, we suggest a new regularization functional with a data alignment term that maximizes the number of (weakly-oriented) data points contained by a surface while allowing for some measurement errors. Second, we propose a touch-expand algorithm for finding a minimum cut on a huge 3D grid using an automatically adjusted band. This overcomes prohibitively high memory cost of graph cuts when computing globally optimal surfaces at high-resolution. Our results for sparse or incomplete 3D data from laser scanning and passive multi-view stereo are robust to noise, outliers, missing parts, and varying sampling density.
  • Keywords
    graph theory; image reconstruction; image resolution; measurement errors; stereo image processing; surface fitting; 3D shape reconstruction; data alignment term; graph cuts; laser scanning; measurement errors; passive multiview stereo; regularization functional; sampling density; shape fitting global optimization; sparse feature-based stereo; surface resolution; touch-expand algorithm; Computer science; Cost function; Mathematics; Measurement errors; Mechanical variables measurement; Noise shaping; Optimization methods; Shape measurement; Surface fitting; Surface reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1063-6919
  • Print_ISBN
    1-4244-1179-3
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2007.383293
  • Filename
    4270318