Title :
Testability trade-offs for BIST RTL data paths: the case for three dimensional design space
Author :
Nicolici, Nicola ; Al-Hashimi, Bashir M.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Abstract :
Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation
Keywords :
built-in self test; design for testability; discrete cosine transforms; high level synthesis; logic testing; BIST RTL data paths; area overhead; power dissipation; reliability; test application time; testability trade-offs; three dimensional design space; yield; Application software; Automatic testing; Built-in self-test; Computer aided software engineering; Discrete cosine transforms; Power dissipation; Power engineering computing; Space technology; System testing; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915128
