DocumentCode
3018571
Title
The Ultimate Chase
Author
Krishnamurthy, Prabhu
Author_Institution
LSI Logic Corp.
fYear
2005
fDate
18-21 Dec. 2005
Firstpage
454
Lastpage
454
Abstract
Defects - they come in various shapes and sizes; they make the difference between good and bad; they make us sweat and swear. Catching them all has remained a challenge and will continue to be, for years to come.
Keywords
Built-in self-test; Circuit faults; Circuit testing; Costs; Delay effects; Large scale integration; Logic; Shape; Test pattern generators; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. Proceedings. 14th Asian
ISSN
1081-7735
Print_ISBN
0-7695-2481-8
Type
conf
DOI
10.1109/ATS.2005.107
Filename
1575474
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