Abstract :
The presentation includes an overview of challenges in testing analog, mixed signal, and RF SoCs, and presents alternative solutions to ATE functional testing for products that are suitable for high volume manufacturing. This talk presents a different level of granularity within mixed signal SoC testing by abstracting the systems in terms of product types, specifications, interfaces, or building blocks. This way, the final testing of the SoC becomes an aggregation of the test techniques targeted for particular product types, interfaces, and building blocks incorporated in the system. Several industrial examples of production testing of mixed-signal and RF devices are presented in this talk
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; ATE functional testing; RF system-on-chips; automatic test equipment; mixed signal SoC testing; mixed-signal integrated circuits; production testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Manufacturing; Production; RF signals; Radio frequency; Sun; System testing;
