DocumentCode :
3018770
Title :
Challenges in High Speed Interface Testing
Author :
Abdennadher, Salem ; Shaikh, Saghir A.
Author_Institution :
Intel Corporation, Folsom, CA
fYear :
2005
fDate :
18-21 Dec. 2005
Firstpage :
468
Lastpage :
468
Abstract :
There is a common trend towards the incorporation of Serial Interfaces into Systems-on-Chips (SoC), both for inter-chip and intra-chip high-bandwidth data transfers. Serial interfaces have the same channel medium drives as Parallel interfaces and provide increased data rates and fewer interconnects. High speed serial interfaces, such as SATA, Hyper- Transport, and PCI Express, are becoming pervasive in networking and in computer equipment. Some computer interfaces are converging to communications interfaces. Today, speeds for these serial interfaces range from 1.5 to 3.3 Gbps; in the near future, they will reach 6.4 Gbps and beyond (Figure 1).
Keywords :
Automatic testing; Clocks; Computer interfaces; Computer networks; Manufacturing; Pervasive computing; Power measurement; Sun; Time measurement; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2481-8
Type :
conf
DOI :
10.1109/ATS.2005.33
Filename :
1575485
Link To Document :
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