DocumentCode :
3018775
Title :
Color constancy and non-uniform illumination: Can existing algorithms work?
Author :
Bleier, Michael ; Riess, Christian ; Beigpour, Shida ; Eibenberger, Eva ; Angelopoulou, Elli ; Tröger, Tobias ; Kaup, André
Author_Institution :
Pattern Recognition Lab., Univ. of Erlangen-Nuremberg, Erlangen, Germany
fYear :
2011
fDate :
6-13 Nov. 2011
Firstpage :
774
Lastpage :
781
Abstract :
The color and distribution of illuminants can significantly alter the appearance of a scene. The goal of color constancy (CC) is to remove the color bias introduced by the illuminants. Most existing CC algorithms assume a uniformly illuminated scene. However, more often than not, this assumption is an insufficient approximation of real-world illumination conditions (multiple light sources, shadows, interreflections, etc.). Thus, illumination should be locally determined, taking under consideration that multiple illuminants may be present. In this paper we investigate the suitability of adapting 5 state-of-the-art color constancy methods so that they can be used for local illuminant estimation. Given an arbitrary image, we segment it into superpixels of approximately similar color. Each of the methods is applied independently on every superpixel. For improved accuracy, these independent estimates are combined into a single illuminant-color value per superpixel. We evaluated different fusion methodologies. Our experiments indicate that the best performance is obtained by fusion strategies that combine the outputs of the estimators using regression.
Keywords :
image colour analysis; image fusion; image resolution; image segmentation; lighting; regression analysis; color bias removal; color constancy methods; fusion methodologies; local illuminant estimation; nonuniform illumination; regression; superpixel segmentation; Bayesian methods; Databases; Estimation; Image color analysis; Image segmentation; Light sources; Lighting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision Workshops (ICCV Workshops), 2011 IEEE International Conference on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4673-0062-9
Type :
conf
DOI :
10.1109/ICCVW.2011.6130331
Filename :
6130331
Link To Document :
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