• DocumentCode
    3019191
  • Title

    PMN-PT single crystal thick films on silicon substrate for high-frequency micromachined ultrasonic transducers

  • Author

    Peng, Jue ; Lau, Sienting ; Chao, Chen ; Dai, Jiyan ; Chan, Helen L.W. ; Lu, Haosu ; Zhou, Q.F. ; Shung, K.K.

  • Author_Institution
    Dept. of Appl. Phys., Hong Kong Polytech. Univ., Hong Kong
  • fYear
    2008
  • fDate
    2-5 Nov. 2008
  • Firstpage
    161
  • Lastpage
    163
  • Abstract
    In this work, a novel high-frequency ultrasonic transducer structure is realized by using PMNPT-on-silicon technology and silicon micromachining. To prepare the single crystalline PMNPT-on-silicon wafers, a hybrid processing method involving wafer bonding, mechanical lapping and wet chemical thinning is successfully developed. The active element is fixed within the stainless steel needle housing. The measured center frequency and -6 dB bandwidth of the transducer are 35 MHz and 34%, respectively. Owing to the excellent electromechanical property of PMNPT film, the transducer shows good energy conversion performance with a very low insertion loss down to 8.3 dB at the center frequency.
  • Keywords
    bioMEMS; biomedical transducers; biomedical ultrasonics; lapping (machining); lead compounds; micromachining; needles; silicon; stainless steel; thick film devices; ultrasonic transducers; wafer bonding; FeCCrJk; PMN-PT single crystal thick film; PMN-PbTiO3-Si; PMNPT-on-silicon technology; arterial wall; electromechanical property; energy conversion performance; frequency 35 MHz; high-frequency ultrasonic transducer; hybrid processing method; mechanical lapping; silicon micromachining; wafer bonding; wet chemical thinning; Chemical processes; Chemical technology; Crystallization; Lapping; Micromachining; Silicon; Substrates; Thick films; Ultrasonic transducers; Wafer bonding; PMN-PT; pMUT; ultrasound transducer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2008. IUS 2008. IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2428-3
  • Electronic_ISBN
    978-1-4244-2480-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2008.0039
  • Filename
    4803311