DocumentCode :
3019193
Title :
Thermal comparison of plate, extrusion heat sink, and skive heat sink
Author :
Yang, Michael C.
Author_Institution :
Motorola Inc., Fort Worth, TX, USA
fYear :
2001
fDate :
2001
Firstpage :
102
Lastpage :
106
Abstract :
Due to the high power dissipation values of power amplifiers, large temperature gradients exist, resulting in localized hot spots around the devices. These hot spots cause high device junction temperatures. Generally speaking, the higher junction temperature increases, the lower reliability will be. Thus, improving the heat spreading is very important. Several methods can be used to improve heat spreading. Skiving is a process of cutting off in thin layers or paring. Skiving is a high throughput manufacturing process that produces high surface area heat sinks at low cost. The entire extruded material is skived and then the heat sinks are cut to the desired length. The high process throughput results in low cost. In quantities of 1000 units, a 100 mm×70 mm×25 mm heat sink costs approximately $3.50. A detailed comparison demonstrates the heat absorption capability of using aluminum plate, aluminum plate with skive heat sink, and extrusion heat sink under laminar flow (free convection) and turbulent flow (forced convection) environments. Two CFD thermal analysis software packages (Icepak and Flotherm) are used to compare experimental results
Keywords :
aluminium; cutting; extrusion; forced convection; heat sinks; integrated circuit packaging; integrated circuit reliability; laminar flow; machining; natural convection; power amplifiers; temperature distribution; thermal analysis; thermal management (packaging); turbulence; 100 mm; 25 mm; 70 mm; Al plate; CFD thermal analysis software packages; Flotherm CFD package; Icepak CFD package; aluminum plate; device junction temperatures; extruded material skiving; extrusion heat sink; forced convection; free convection; heat absorption; heat sink cutting; heat sink surface area; heat sinks; heat spreading; laminar flow; localized hot spots; manufacturing process; paring; power amplifiers; power dissipation; process throughput; reliability; skive heat sink; skiving; temperature gradients; thermal comparison; throughput; turbulent flow; Absorption; Aluminum; Computational fluid dynamics; Costs; Heat sinks; High power amplifiers; Manufacturing processes; Power dissipation; Temperature; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6649-2
Type :
conf
DOI :
10.1109/STHERM.2001.915156
Filename :
915156
Link To Document :
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