DocumentCode
3019271
Title
Interconnect estimation and planning for deep submicron designs
Author
Cong, Jason ; Pan, David Zhigang
Author_Institution
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
fYear
1999
fDate
1999
Firstpage
507
Lastpage
510
Abstract
This paper reports two sets of important results in our exploration of an interconnect-centric design flow for deep submicron (DSM) designs: (i) We obtain efficient yet accurate wiring area estimation models for optimal wire sizing (OWS). We also propose a simple metric to guide area-efficient performance optimization; (ii) Guided by our interconnect estimation models, we study the interconnect architecture planning problem for wire-width designs. We achieve a rather surprising result which suggests that two pre-determined wire widths per metal layer are sufficient to achieve near-optimal performance. This result will greatly simplify the routing architecture and tools for DSM designs. We believe that our interconnect estimation and planning results will have a significant impact on DSM designs
Keywords
VLSI; circuit layout CAD; circuit optimisation; integrated circuit design; integrated circuit interconnections; network routing; wiring; area-efficient performance optimization; deep submicron designs; interconnect estimation; interconnect planning; interconnect-centric design flow; optimal wire sizing; pre-determined wire widths; routing architecture; wire-width designs; wiring area estimation models; Capacitance; Computer science; Contracts; Costs; Delay estimation; Integrated circuit interconnections; Permission; Very large scale integration; Wire; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location
New Orleans, LA
Print_ISBN
1-58113-092-9
Type
conf
DOI
10.1109/DAC.1999.781368
Filename
781368
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