Title :
Interconnect estimation and planning for deep submicron designs
Author :
Cong, Jason ; Pan, David Zhigang
Author_Institution :
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
Abstract :
This paper reports two sets of important results in our exploration of an interconnect-centric design flow for deep submicron (DSM) designs: (i) We obtain efficient yet accurate wiring area estimation models for optimal wire sizing (OWS). We also propose a simple metric to guide area-efficient performance optimization; (ii) Guided by our interconnect estimation models, we study the interconnect architecture planning problem for wire-width designs. We achieve a rather surprising result which suggests that two pre-determined wire widths per metal layer are sufficient to achieve near-optimal performance. This result will greatly simplify the routing architecture and tools for DSM designs. We believe that our interconnect estimation and planning results will have a significant impact on DSM designs
Keywords :
VLSI; circuit layout CAD; circuit optimisation; integrated circuit design; integrated circuit interconnections; network routing; wiring; area-efficient performance optimization; deep submicron designs; interconnect estimation; interconnect planning; interconnect-centric design flow; optimal wire sizing; pre-determined wire widths; routing architecture; wire-width designs; wiring area estimation models; Capacitance; Computer science; Contracts; Costs; Delay estimation; Integrated circuit interconnections; Permission; Very large scale integration; Wire; Wiring;
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
DOI :
10.1109/DAC.1999.781368