Title :
Optical Reflectometry for In-situ Monitoring of Carbon Nanotubes Deposition by Optical Tweezers
Author :
Kashiwagi, Ken ; Yamashita, Shinji ; Set, Sze Yun
Author_Institution :
Univ. of Tokyo, Tokyo
Abstract :
Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of layer uniformity is observed through damping of reflectivity fluctuation.
Keywords :
carbon nanotubes; radiation pressure; reflectivity; reflectometry; C; carbon nanotube deposition; optical reflectometry; optical tweezers; reflectivity fluctuation; Carbon nanotubes; Erbium-doped fiber amplifier; Monitoring; Optical attenuators; Optical refraction; Optical sensors; Optical variables control; Reflectivity; Reflectometry; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453384
