• DocumentCode
    301963
  • Title

    Gain stage design based on narrow-width methodology in SOI technology

  • Author

    Cheung, Denny T Y ; Lau, Jack ; Chan, Philip C.H.

  • Author_Institution
    Dept. of EEE., Hong Kong Univ. of Sci. & Technol., Hong Kong
  • Volume
    1
  • fYear
    1996
  • fDate
    12-15 May 1996
  • Firstpage
    219
  • Abstract
    An optimized gain stage design strategy for operational amplifiers in 2 μm SOI technology is described. This approach is known as Narrow-Width Methodology (NWM), which offers a parasitic capacitance reduction in the significant node as compared with bulk technology because of the isolated mesa used in SOI technology. Therefore, when a two-stage Miller compensated op amp is designed, a smaller Miller compensation capacitance (Cc) is employed to ensure stability. Moreover, the performance of unity-gain frequency (funity) is improved. Simulation results show that, when NWM is implemented in the output transistor, funity can be achieved up to 180 MHz with Cc=0.045 pF in SOI technology, while funity equals 84 MHz with Cc=0.095 pF in bulk counterparts
  • Keywords
    analogue integrated circuits; capacitance; circuit stability; compensation; frequency response; integrated circuit design; linear network synthesis; operational amplifiers; silicon-on-insulator; 0.045 pF; 180 MHz; 2 micron; Miller compensation capacitance; SOI technology; Si; isolated mesa; narrow-width methodology; operational amplifier; optimized gain stage design strategy; parasitic capacitance reduction; stability; two-stage Miller compensated op amp; unity-gain frequency; Circuit simulation; Design optimization; Equations; Isolation technology; Lifting equipment; Operational amplifiers; Parasitic capacitance; SPICE; Silicon; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3073-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1996.539868
  • Filename
    539868