Title :
The study of micro-fin heat sinks for electronic cooling applications
Author :
Chien, Heng-Chieh ; Tseng, Ming-Hsi ; Wang, Chih-Yao ; Chun-Hsun, Chu
Author_Institution :
Electron. Res. & Service Organ., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Abstract :
A variety of pin fin parameters were studied and tested to calculate an empirical relationship which can predict the optimum thermal performance of the micro pin fin structure. The sample parameters tested are as follows: (1) fin size from 0.2 mm to 1.0 mm; (2) fin height from 2.0 mm to 10.0 mm. The errors from comparison of the empirical relationship with the test data are less than 5%, so we can use this empirical relationship to estimate the optimum performance of pin fin heat sinks. According to the results from empirical relationship, the ratio of optimum fin pitch to fin size (fin pitch/fin size) is about 1.5~1.7. Greater fin height gives higher thermal performance, and a smaller fin size structure has the potential for better thermal performance than huge fin size structures
Keywords :
cooling; heat sinks; integrated circuit packaging; integrated circuit testing; optimisation; thermal analysis; thermal management (packaging); 0.2 to 1 mm; 2 to 10 mm; electronic cooling applications; empirical relationship; fin height; fin size; micro pin fin structure; micro-fin heat sinks; optimum fin pitch/fin size ratio; optimum performance; optimum thermal performance; pin fin heat sinks; pin fin parameters; sample parameters; test data; thermal performance; Electronics cooling; Electronics industry; Heat sinks; Heat transfer; Industrial electronics; Industrial relations; Microprocessors; Pins; Testing; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6649-2
DOI :
10.1109/STHERM.2001.915181