• DocumentCode
    3019878
  • Title

    A 6-Gb/s 3X-oversampling-like clock and data recovery in 0.13-µm CMOS technology

  • Author

    Jiang, Bo-Qian ; Hung, Cheng-Liang ; Chen, Bing-Hung ; Cheng, Kuo-Hsing

  • Author_Institution
    Dept. of Electr. Eng., Nat. Center Univ., Jungli, Taiwan
  • fYear
    2012
  • fDate
    20-23 May 2012
  • Firstpage
    2597
  • Lastpage
    2600
  • Abstract
    This study presents a 6-Gb/s clock and data recovery (CDR) for the high-speed data transmission systems. Similar to the concept of the oversampling CDR, the proposed CDR presents an alternative scheme, which uses the data delay window (DDW) and a sensing-amplified phase detector (SAPD) to substitute the conventional DFF-based PD. It shows that the NRZ data could be aligned and recovered by the only one clock instead of the multi-phase clock, and the complexity of the clock distribution network could be mitigated than counterpart. The study has been implemented in TSMC 0.13 um. Operating at the 6-Gb/s data rate and 3-GHz clock frequency, the estimated peak to peak jitter of the recovered clock is 7.55 ps, and the recovered data jitter is less than 6.4 ps. The core area of data recovery (DR) loop occupies 0.291 mm2. The core power consumption of the all loops including I/O buffer is around 50 mW at the supply voltage of 1.2V.
  • Keywords
    CMOS integrated circuits; buffer circuits; clock and data recovery circuits; clock distribution networks; jitter; phase detectors; power supply circuits; CMOS technology; DDW; DFF-based PD; DR loop; I/O buffer; NRZ data; SAPD; bit rate 6 Pbit/s; clock distribution network; clock frequency; core power consumption; data delay window; data rate; data recovery loop; frequency 3 GHz; high-speed data transmission systems; multiphase clock; oversampling CDR; oversampling-like clock and data recovery; peak to peak jitter; recovered clock; recovered data jitter; sensing-amplified phase detector; size 0.13 mum; supply voltage; voltage 1.2 V; CMOS integrated circuits; Clocks; Data communication; Delay; Jitter; Phase locked loops; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
  • Conference_Location
    Seoul
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-0218-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2012.6271836
  • Filename
    6271836