DocumentCode :
3019910
Title :
Contactless testing of on-chip oscillator operation
Author :
Filanovsky, Igor M. ; Moore, Brian
Author_Institution :
Dept. of ECE, Univ. of Alberta, Edmonton, AB, Canada
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
2605
Lastpage :
2608
Abstract :
The on-chip oscillator operation can be verified in a contactless way if the oscillator tank inductance is also used as a transmitting antenna. When the probing (receiver) antenna located on the test head is close to the oscillator, both antennas together may be considered as a transformer. The receiving antenna moving to and from the oscillator disturbs the oscillation frequency and amplitude, and these disturbances are registered by the measuring device connected to the receiving antenna. These disturbances, which are not occurring in ordinary oscillators with constant components, are evaluated using the equivalent circuit of thus formed transformer. The variation of frequency and the primary and secondary amplitudes as functions of distance between antennas are calculated. The results are experimentally verified with the oscillator realized in 0.13 μm CMOS technology.
Keywords :
CMOS integrated circuits; MMIC oscillators; equivalent circuits; receiving antennas; transmitting antennas; CMOS technology; contactless testing; disturbances; equivalent circuit; on-chip oscillator operation; oscillation amplitude; oscillation frequency; oscillator tank inductance; receiver antenna; size 0.13 mum; transformer; transmitting antenna; Antenna measurements; Antennas; Capacitance; Coils; Inductance; Oscillators; Testing; Amplitude and Frequency Disturbances; Contactless testing; Sensors; Transformer Oscillator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271838
Filename :
6271838
Link To Document :
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