Title :
Simulation using code-perturbation: black- and white-box approach
Author :
Yang, Zan ; Min, Byeong ; Choi, Gwan
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
This paper presents a new approach in simulation-based hardware verification, which uses application programs as the test inputs. The approach perturbs the program-control-flow during the simulation to exhaust all branching possibilities in a verification program. It keeps the structure of the verification program at code-segment level and takes significantly less time than the straightforward simulation approach does. This approach can be further classified into two categories: the black-box approach and the white-box approach. The black-box approach can be applied to a wide range of programs. It is a cost-efficient method for verifying the integrated model of the hardware/software systems. On the other hand, the white-box approach can be used to retain the correct software state (the hardware state seen by the software) during a simulation
Keywords :
C language; digital simulation; fault diagnosis; formal verification; hardware-software codesign; logic testing; black-box approach; branching possibilities; code-perturbation simulation; code-segment level; cost-efficient method; hardware/software systems; program-control-flow; simulation-based hardware verification; white-box approach; Application software; Circuit faults; Circuit simulation; Circuit testing; Computer errors; Electrical fault detection; Emulation; Fault detection; Hardware; Production systems;
Conference_Titel :
Quality Electronic Design, 2001 International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-1025-6
DOI :
10.1109/ISQED.2001.915204