Title :
Application of lithium niobate etch stop technology to SAW pressure sensors
Author :
Randles, Andrew B. ; Kuypers, Jan H. ; Esashi, Masayoshi ; Tanaka, Shuji
Author_Institution :
Dept. of Nanomech., Tohoku Univ., Sendai
Abstract :
This paper presents a process technology to form thin diaphragms with sealed cavities in a lithium niobate (LiNbO3) wafer, which will be used for small and sensitive SAW-based pressure sensors. The process technology uses thermal inversion, wet etching with an electroplated Au mask, etch stop at the thermal inversion layer and Au-Au bonding. By the combination of an etch stop and pinhole-free masking, LiNbO3 thin diaphragms with thicknesses of several tens of mum to 10 mum were fabricated in 128deg Y cut LiNbO3 wafers. The Au-Au bonding of the LiNbO3 wafer gave hermetic sealing. In addition the etch profiles of the LiNbO3 wafer predicted by Wulff-Jaccodine plots and observed in experiments were compared, and good agreement was confirmed.
Keywords :
diaphragms; etching; lithium compounds; masks; micromachining; microsensors; pressure sensors; surface acoustic wave delay lines; surface acoustic wave transducers; ultrasonic transducers; LiNbO3; SAW based pressure sensors; SAW pressure sensors; Wulff-Jaccodine plots; electroplated gold mask; gold-gold bonding; hermetic sealing; lithium niobate wafer etch stop; pinhole free masking; process technology; sealed cavities; thermal inversion layer; thin diaphragms; wet etching; Acoustic devices; Acoustic sensors; Delay; Etching; Lithium niobate; Paper technology; Sensor phenomena and characterization; Surface acoustic waves; Transducers; Wafer bonding;
Conference_Titel :
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2428-3
Electronic_ISBN :
978-1-4244-2480-1
DOI :
10.1109/ULTSYM.2008.0271