Title :
A novel physical defects recovery technique for FPGA-IP cores
Author :
Nishitani, Y. ; Inoue, Ken ; Amagasaki, Motoki ; Iida, Michihisa ; Kuga, Morihiro ; Sueyoshi, Tetsuro
Author_Institution :
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
Abstract :
FPGA fault detection consumes a great deal of test time compared with ASICs because FPGAs have complex structures. Re-placement and re-routing must be performed to avoid fault points, which causes an increase in recovery time and degrades performance. Therefore, we propose a fault detection method and develop placement and routing tools to avoid fault sources in tile and multiplexer level avoidance, respectively. In the evaluation, the detection method diagnosed faulty MUXes with six test configurations. We found that the performance of a faulty FPGA slightly decreased by 2% compared with a normal FPGA in multiplexer level avoidance.
Keywords :
fault tolerant computing; field programmable gate arrays; logic testing; microprocessor chips; multiplexing equipment; network routing; performance evaluation; FPGA fault detection; FPGA-IP cores; fault detection method; fault point avoidance; fault source avoidance; faulty FPGA performance degradation; faulty MUXes; multiplexer level avoidance; physical defects recovery technique; placement tools; recovery time; replacement; rerouting; routing tools; test configurations; test time; tile level avoidance; Circuit faults; Fault detection; Field programmable gate arrays; Multiplexing; Routing; Testing; Tiles; FPGA; Fault Recovery;
Conference_Titel :
Reconfigurable Computing and FPGAs (ReConFig), 2012 International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4673-2919-4
DOI :
10.1109/ReConFig.2012.6416766