DocumentCode :
3020138
Title :
Tuning of resistance of nanogaps using field-emission-induced electromigration with feedback control scheme
Author :
Ando, Makoto ; Akimoto, S. ; Suda, Ryutaro ; Shirakashi, Jun-ichi
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Univ. of Agric. & Technol., Koganei, Japan
fYear :
2013
fDate :
5-8 Aug. 2013
Firstpage :
1141
Lastpage :
1144
Abstract :
We report a newly investigated technique for the tuning of tunnel resistance of nanogaps using electromigration phenomena induced by a field emission current, which is called “activation” method. First, Planar-type initial nanogaps of Ni separated by 20-50 nm were defined on SiO2/Si substrates. Then, a bias current was applied to the initial Ni nanogaps at room temperature using a current source. Here, we propose a feedback approach during activation procedures, in order to precisely control the resistance of nanogaps at room temperature. We call this method “feedback-controlled activation (FCA)”, and it is revealed that control characteristics of tunnel resistance of nanogaps are successfully improved using FCA procedure, as compared with conventional activation without feedback scheme. These results indicate that a feedback approach is useful for the stable control of tunnel resistance of nanogaps using activation method.
Keywords :
electromigration; energy gap; feedback; field emission; nanostructured materials; FCA procedure; Ni separation; SiO2-Si substrates; SiO2-Si; activation method; activation procedure; bias current; current source; feedback control scheme; feedback-controlled activation; field emission current; field-emission-induced electromigration; initial Ni nanogaps; nanogap resistance control; nanogap resistance tuning; planar-type initial nanogaps; size 20 nm to 50 nm; temperature 293 K to 298 K; tunnel resistance control; tunnel resistance tuning; Electrodes; Electromigration; Histograms; Junctions; Nickel; Resistance; Tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
Conference_Location :
Beijing
ISSN :
1944-9399
Print_ISBN :
978-1-4799-0675-8
Type :
conf
DOI :
10.1109/NANO.2013.6721060
Filename :
6721060
Link To Document :
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