DocumentCode :
3020195
Title :
Sparse Kernels for Bayes Optimal Discriminant Analysis
Author :
Hamsici, Onur C. ; Martinez, Aleix M.
Author_Institution :
Ohio State Univ., Columbus
fYear :
2007
fDate :
17-22 June 2007
Firstpage :
1
Lastpage :
7
Abstract :
Discriminant Analysis (DA) methods have demonstrated their utility in countless applications in computer vision and other areas of research - especially in the C class classification problem. The most popular approach is linear DA (LDA), which provides the C - 1-dimensional Bayes optimal solution, but only when all the class covariance matrices are identical. This is rarely the case in practice. To alleviate this restriction, Kernel LDA (KLDA) has been proposed. In this approach, we first (intrinsically) map the original nonlinear problem to a linear one and then use LDA to find the C - 1-dimensional Bayes optimal subspace. However, the use of KLDA is hampered by its computational cost, given by the number of training samples available and by the limitedness of LDA in providing a C - 1-dimensional solution space. In this paper, we first extend the definition of LDA to provide subspace of q < C - 1 dimensions where the Bayes error is minimized. Then, to reduce the computational burden of the derived solution, we define a sparse kernel representation, which is able to automatically select the most appropriate sample feature vectors that represent the kernel. We demonstrate the superiority of the proposed approach on several standard datasets. Comparisons are drawn with a large number of known DA algorithms.
Keywords :
Bayes methods; computer vision; covariance matrices; Bayes optimal discriminant analysis; Bayes optimal solution; Bayes optimal subspace; C class classification problem; Kernel LDA; class covariance matrices; computational cost; computer vision; nonlinear problem; sparse kernels; Application software; Computational efficiency; Computer vision; Covariance matrix; Hilbert space; Kernel; Linear discriminant analysis; Matrix converters; Symmetric matrices; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
Conference_Location :
Minneapolis, MN
ISSN :
1063-6919
Print_ISBN :
1-4244-1179-3
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2007.383409
Filename :
4270407
Link To Document :
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