Title :
Numerical investigation on the junctionless nanowire FET
Author :
Gnani, E. ; Gnudi, A. ; Reggiani, S. ; Baccarani, G. ; Shen, N. ; Singh, N. ; Lo, G.Q. ; Kwong, D.L.
Author_Institution :
ARCES-DEIS, Univ. of Bologna, Bologna, Italy
Abstract :
In this work we investigate by numerical simulation the electrical properties of the junctionless nanowire field-effect transistor, which has recently been proposed as a possible alternative to the junction-based FET. The numerical model assumes a cylindrical geometry and is meant to provide a physical understanding of the device behavior by highlighting the features of the I-V and C-V characteristics, as well as the electrostatic potential and carrier concentration within the channel. Numerical results are compared with the experimental turn-on characteristics and are found to provide a generally-good agreement. Finally, we discuss the strengths and the limitations of this device as a possible candidate for future technology nodes.
Keywords :
field effect transistors; nanowires; numerical analysis; C-V characteristics; I-V characteristics; carrier concentration; cylindrical geometry; electrical property; electrostatic potential; junctionless nanowire FET; junctionless nanowire field-effect transistor; numerical investigation; numerical model; numerical simulation; Capacitance; Electric potential; Impurities; Junctions; Logic gates; Neodymium; Schottky barriers;
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2011 12th International Conference on
Conference_Location :
Cork
Print_ISBN :
978-1-4577-0090-3
Electronic_ISBN :
978-1-4577-0089-7
DOI :
10.1109/ULIS.2011.5757981