Title :
A model for crosstalk noise evaluation in deep submicron processes
Author :
Sabet, Pirouz Bazargan ; Ilponse, Fabrice
Author_Institution :
Paris VI Univ., France
Abstract :
To certify, the correctness of a design, in deep submicron technologies, the verification process has to cover some new issues. The noise introduced on signals through the crosstalk coupling is one of these emerging problems. In this paper, we propose a model to evaluate the peak value of the noise injected on a signal during the transition of its neighboring signals. This model has been used in a prototype verification tool and has shown a satisfying accuracy within a reasonable computation delay
Keywords :
VLSI; crosstalk; integrated circuit design; integrated circuit modelling; integrated circuit noise; crosstalk coupling; crosstalk noise evaluation model; deep submicron processes; peak noise value; verification tool; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Delay; Design methodology; Integrated circuit technology; Signal processing; Steady-state; Wires;
Conference_Titel :
Quality Electronic Design, 2001 International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-1025-6
DOI :
10.1109/ISQED.2001.915218
