• DocumentCode
    3020400
  • Title

    Effective on-chip inductance modeling for multiple signal lines and application on repeater insertion

  • Author

    Cao, Yu ; Huang, Xuejue ; Chang, Norman ; Lin, Shen ; Nakagawa, O. Sam ; Xie, Weize ; Hu, Chenming

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    185
  • Lastpage
    190
  • Abstract
    A new approach to handle the inductance effect on multiple signal lines is presented. The worst case switching pattern is first identified. Then a numerical approach is used to model the effective loop inductance (Leff) for multiple lines. Based on look-up table for Leff, an equivalent single line model can be generated to decouple a specific signal line from the others to perform static timing analysis. Compared to the use of full RLC netlist for multiple lines, this approach greatly improves the computation efficiency and maintains accuracy for timing and signal integrity analysis. Applications to repeater insertion in the critical path chains are demonstrated. For a single line, the RLC model minimizes delay with fewer number of repeaters than RC model. However, for multiple lines, we find that same number of repeaters is inserted for optimal delay according to both the RC and RLC multiple line models
  • Keywords
    VLSI; inductance; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; repeaters; table lookup; timing; RC model; RLC model; VLSI design; critical path; deep-sub-micron technology; delay; effective loop inductance; integrated circuit interconnect; look-up table; multiple signal lines; numerical simulation; on-chip inductance; repeater insertion; signal integrity; switching pattern; timing analysis; Capacitance; Clocks; Crosstalk; Delay; Frequency; Inductance; Leg; Repeaters; Signal analysis; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2001 International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-1025-6
  • Type

    conf

  • DOI
    10.1109/ISQED.2001.915225
  • Filename
    915225