DocumentCode
3020550
Title
Structured Semi-supervised Discriminant Analysis
Author
Yang, Ming ; Yuan, Xing-mei
Author_Institution
Sch. of Comput. Sci. & Technol., Nanjing Normal Univ., Nanjing, China
fYear
2009
fDate
12-15 July 2009
Firstpage
148
Lastpage
153
Abstract
Classical linear discriminant analysis (LDA) is an effective dimensionality reduction method which preserve class separabiliy by maximizing the between class covariance and simultaneously minimizing the within class covariance. But, the covariance matrix of each class may not be accurately estimated when the given training samples is not sufficient. To overcome this disadvantage of LDA, a novel semi-supervised discriminant analysis (SDA) was introduced, which can effectively utilize the labeled and unlabeled samples. However, SDA still can not fully use the structure information hidden in data, since the samples in a class may be scattered in several regions. Therefore, in this paper, we introduce a novel approach, called structured semi-supervised discriminant analysis (SSDA), which exploits the data structures hidden in samples in a class via semi-supervised clustering methods and uses them as ldquodifferent classesrdquo in calculating the between class covariance, hence it is an extension and improvement of SDA. Experiments on 2 artificial datasets and 8 real-life dataset show the effectiveness of our algorithm.
Keywords
covariance matrices; data structures; learning (artificial intelligence); pattern clustering; class separabiliy preservation; covariance matrix; data structures; dimensionality reduction method; linear discriminant analysis; semisupervised clustering methods; semisupervised learning; structured semisupervised discriminant analysis; Clustering methods; Covariance matrix; Data structures; Feature extraction; Linear discriminant analysis; Pattern analysis; Pattern recognition; Scattering; Semisupervised learning; Wavelet analysis; Dimensionality reduction; Discriminant Analysis; Semi-supervised learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2009. ICWAPR 2009. International Conference on
Conference_Location
Baoding
Print_ISBN
978-1-4244-3728-3
Electronic_ISBN
978-1-4244-3729-0
Type
conf
DOI
10.1109/ICWAPR.2009.5207467
Filename
5207467
Link To Document