• DocumentCode
    3020550
  • Title

    Structured Semi-supervised Discriminant Analysis

  • Author

    Yang, Ming ; Yuan, Xing-mei

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Nanjing Normal Univ., Nanjing, China
  • fYear
    2009
  • fDate
    12-15 July 2009
  • Firstpage
    148
  • Lastpage
    153
  • Abstract
    Classical linear discriminant analysis (LDA) is an effective dimensionality reduction method which preserve class separabiliy by maximizing the between class covariance and simultaneously minimizing the within class covariance. But, the covariance matrix of each class may not be accurately estimated when the given training samples is not sufficient. To overcome this disadvantage of LDA, a novel semi-supervised discriminant analysis (SDA) was introduced, which can effectively utilize the labeled and unlabeled samples. However, SDA still can not fully use the structure information hidden in data, since the samples in a class may be scattered in several regions. Therefore, in this paper, we introduce a novel approach, called structured semi-supervised discriminant analysis (SSDA), which exploits the data structures hidden in samples in a class via semi-supervised clustering methods and uses them as ldquodifferent classesrdquo in calculating the between class covariance, hence it is an extension and improvement of SDA. Experiments on 2 artificial datasets and 8 real-life dataset show the effectiveness of our algorithm.
  • Keywords
    covariance matrices; data structures; learning (artificial intelligence); pattern clustering; class separabiliy preservation; covariance matrix; data structures; dimensionality reduction method; linear discriminant analysis; semisupervised clustering methods; semisupervised learning; structured semisupervised discriminant analysis; Clustering methods; Covariance matrix; Data structures; Feature extraction; Linear discriminant analysis; Pattern analysis; Pattern recognition; Scattering; Semisupervised learning; Wavelet analysis; Dimensionality reduction; Discriminant Analysis; Semi-supervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition, 2009. ICWAPR 2009. International Conference on
  • Conference_Location
    Baoding
  • Print_ISBN
    978-1-4244-3728-3
  • Electronic_ISBN
    978-1-4244-3729-0
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2009.5207467
  • Filename
    5207467