DocumentCode :
3020727
Title :
Full quiescent current enhancement technique for improving transient response on the output-capacitorless Low-Dropout regulator
Author :
Wu, Chun-Hsun ; Chang-Chien, Le-Ren
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
2733
Lastpage :
2736
Abstract :
Low-Dropout voltage regulators (LDOs) have been widely used in the mobile electronic devices. Due to the purpose of energy saving, LDOs are preferred to perform fast transient response with low quiescent current as they operate at low supply voltage condition. This paper proposes a full quiescent current boosting circuit (FQCB) that is augmented to the LDO for further accelerating the response during the load transient. Compared to the other dynamic bias approach, the proposed technique raises the quiescent current to the maximum quantity during the load transient for maximizing the dynamic bias effect. The designed LDO was implemented by a 0.35μm CMOS process. Testing results show that the voltage spike is reduced by 65% compared with the LDO without the proposed circuit under the 50mA load change within 300ns. The recovery time is less than 1μs and the stability is guaranteed.
Keywords :
CMOS integrated circuits; transient response; voltage regulators; CMOS process; dynamic bias approach; dynamic bias effect; energy saving; full quiescent current boosting circuit; full quiescent current enhancement; load transient; low supply voltage condition; mobile electronic devices; output-capacitorless low-dropout regulator; size 0.35 mum; transient response; voltage spike; Boosting; Capacitors; MOSFET circuits; Regulators; Transient analysis; Transient response; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271874
Filename :
6271874
Link To Document :
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