DocumentCode :
3020873
Title :
Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices
Author :
Makovejev, S. ; Kilchytska, V. ; Arshad, M. K Md ; Flandre, D. ; Andrieu, F. ; Faynot, O. ; Olsen, S. ; Raskin, J.P.
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
Self-heating and substrate effects are discussed and qualitatively compared in the ultra-thin body ultra-thin BOX (UTB2) devices without a ground plane. Ultra-thin body is aggravating thermal properties of the devices due to the interface effects. Ultra-thin BOX (10 nm) improves heat dissipation from the channel to the bulk silicon substrate but also results in strongly pronounced substrate effects. It is observed that output conductance degradation in the UTB2 devices due to the substrate effects can be as strong as degradation due to the self-heating.
Keywords :
cooling; silicon-on-insulator; substrates; thermal conductivity; Si; heat dissipation; self-heating effect; silicon substrate; size 10 nm; substrate effect; thermal conductivity; ultra-thin body ultra-thin BOX device; Degradation; Frequency response; Heating; Logic gates; MOSFETs; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration on Silicon (ULIS), 2011 12th International Conference on
Conference_Location :
Cork
Print_ISBN :
978-1-4577-0090-3
Electronic_ISBN :
978-1-4577-0089-7
Type :
conf
DOI :
10.1109/ULIS.2011.5758009
Filename :
5758009
Link To Document :
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