Title :
Frequency Domain Analysis of Transient Interference
Author :
Su-min, Han ; Wei, Zhang ; Dong-lei, Xie ; Jian-hai, Liu
Author_Institution :
Inst. of Electr. Eng., Henan Polytech. Univ., Jiaozuo, China
Abstract :
According to the real situation of severe transient disturbance , also easily causing equipment malfunction in the substation. The study analyzed the mechanism and features of transient disturbances in the substation, and drew the typical waveforms. Next, the EFT interference sources been imposed on the test device, experimental data was obtained by the digital oscilloscope. According to a single EFT / B double-exponential waveform, frequency domain analysis was done. By double-exponential model of a single EFT / B signal and experimental data, frequency-domain analysis was carried on. The simulation results and experimental results show that, EFT / B signal spectrum components is below of 100 M, focusing on 40M below. This results will provide reference and basis for EFT / B interference for shielding and rejecting, and provide guidance to analyze electrostatic discharge and lightning surge signal in the frequency-domain.
Keywords :
digital storage oscilloscopes; electromagnetic interference; electromagnetic shielding; electrostatic discharge; frequency-domain analysis; lightning protection; power system analysis computing; power system transients; substation protection; surges; transient analysis; waveform analysis; EFT interference; EFT-B signal spectrum component; digital oscilloscope; double-exponential model; electrostatic discharge analysis; equipment malfunction; frequency-domain analysis; lightning surge signal; substation; transient disturbance; transient interference; waveform analysis; Electrical engineering; Electromagnetic compatibility; Frequency domain analysis; Interference; Substations; Transient analysis; EFT/B; frequency-domain analysis; transient interference;
Conference_Titel :
Electrical and Control Engineering (ICECE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6880-5
DOI :
10.1109/iCECE.2010.921