Title :
Application of area CMOS image processing for 2-D optoelectronic autocollimator
Author :
Liu Yusheng ; Su Wanxin ; Zhao Yan ; Wang Chunxia ; Li Jianrong
Author_Institution :
Changchun Inst. of Opt., Fine Mech. & Phys., Changchun, China
Abstract :
To meet the increasing requirement for small angle measurement in the field of military and industry, the authors had designed the 2-D optoelectronic autocollimator based on area CMOS image sensor to pursuit higher precision and stability. For hardware circuit, the authors chose the DSP+FPGA structure to build a reliable and high-speed platform. For software algorithms, frame subtraction, Gaussian and Median filtering were effective to reduce the noise of original images. After threshold segmentation, weighted centroid locating algorithm was selected to calculate the sub-pixel location for laser spot. Finally, angle conversion was performed to get the 2-D misalignment angles. Experimental results show that, with the help of the methods of 2-D image processing, the autocollimator can obtain high precision within 0.2" and the capability of anti-interference for misalignment angle measuring.
Keywords :
CMOS image sensors; angular measurement; image processing; optoelectronic devices; precision engineering; 2D image processing; 2D misalignment angles; 2D optoelectronic autocollimator; CMOS image sensor; DSP+FPGA structure; Gaussian filtering; Median filtering; angle conversion; anti-interference; area CMOS image processing; hardware circuit; high-speed platform; higher precision; laser spot; misalignment angle measuring; small angle measurement; software algorithms; stability; sub-pixel location; threshold segmentation; weighted centroid locating algorithm; CMOS integrated circuits; Digital signal processing; Field programmable gate arrays; Filtering; Gray-scale; Lasers; Measurement by laser beam; 2-D optoelectronic autocollimator; DSP+FPGA; combinative filtering; frame substraction; sub-pixel location;
Conference_Titel :
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location :
Shengyang
Print_ISBN :
978-1-4799-2564-3
DOI :
10.1109/MEC.2013.6885150