DocumentCode
3021154
Title
Robust Logistic Principal Component Regression for classification of data in presence of outliers
Author
Wu, H.C. ; Chan, S.C. ; Tsui, K.M.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear
2012
fDate
20-23 May 2012
Firstpage
2809
Lastpage
2812
Abstract
The Logistic Principal Component Regression (LPCR) has found many applications in classification of high-dimensional data, such as tumor classification using microarray data. However, when the measurements are contaminated and/or the observations are mislabeled, the performance of the LPCR will be significantly degraded. In this paper, we propose a new robust LPCR based on M-estimation, which constitutes a versatile framework to reduce the sensitivity of the estimators to outliers. In particular, robust detection rules are used to first remove the contaminated measurements and then a modified Huber function is used to further remove the contributions of the mislabeled observations. Experimental results show that the proposed method generally outperforms the conventional LPCR under the presence of outliers, while maintaining a performance comparable to that obtained under normal condition.
Keywords
data handling; pattern classification; principal component analysis; regression analysis; Huber function; LPCR; data classification; high-dimensional data; microarray data; outliers presence; robust logistic principal component regression; tumor classification; versatile framework; Accuracy; Classification algorithms; Eigenvalues and eigenfunctions; Logistics; Measurement uncertainty; Pollution measurement; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location
Seoul
ISSN
0271-4302
Print_ISBN
978-1-4673-0218-0
Type
conf
DOI
10.1109/ISCAS.2012.6271894
Filename
6271894
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