DocumentCode :
3021339
Title :
A fully qualified analog design flow for nonvolatile memories technologies
Author :
Daglio, P. ; Araldi, M. ; Morbarigazzi, M. ; Roma, C.
Author_Institution :
STMicroelectron. N.V., Milan, Italy
fYear :
2001
fDate :
2001
Firstpage :
451
Lastpage :
455
Abstract :
The wide range and rapid increase in the complexity of CAD tools demands proven and safe design flows. This paper presents a fully validated methodology integrated as analog design flow to design nonvolatile memories. Specifically, it has been applied to designs in 0.35 mm EEPROM and 0.13 um flash memory processes developed in the company. The remarkable feature of the proposed methodology is the excellent integration between CAD tools released by different vendors and internally developed solutions. Furthermore we show a flow which provides full compatibility and flexibility among analog design steps that could cut down time-to-design, time-to-market and streamline the design quality, thus enhancing the circuit yield and robustness
Keywords :
analogue circuits; circuit CAD; circuit optimisation; integrated circuit design; integrated circuit yield; integrated memory circuits; 0.13 micron; 0.35 micron; CAD tools; EEPROM; circuit yield; compatibility; design flows; design quality; flash memory processes; flexibility; fully qualified analog design flow; nonvolatile memories; robustness; time-to-design; time-to-market; Circuit simulation; Circuit testing; Design automation; Design optimization; EPROM; Flash memory; Inductors; Oscillators; Phase noise; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2001 International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-1025-6
Type :
conf
DOI :
10.1109/ISQED.2001.915270
Filename :
915270
Link To Document :
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