Title :
A method of embedded memory access time measurement
Author :
Sung, Nai-Yin ; Wu, Tsung-Yi
Author_Institution :
Taiwan Semicond. Manuf. Comput. Ltd., Hsin-Chu, Taiwan
Abstract :
The memory access time is a vital factor for embedded memory because the access time dominates the embedded memory performance. To characterize the accurate access time in tester for embedded memory is a big issue and an important topic that needs to be researched. The traditional method to measure the embedded memory access time is not accurate enough for the deep submicron environment. Moreover, the traditional method also requires the engineer to repeat it many times by manual trial-and-error in the test machine. This paper presents a new method to measure the embedded memory access time. It uses BIST (Built-in-Self Test) circuitry and modified the March C+ algorithm so that this circuitry can automatically characterize the embedded memory access time in the tester. Moreover, this method can measure the maximum access time for each bit and each address in an embedded memory. This method can guarantee that the access time measured by the tester is the worst condition in the embedded memory
Keywords :
VLSI; application specific integrated circuits; built-in self test; integrated circuit testing; integrated memory circuits; logic testing; time measurement; ASIC; BIST circuitry; March C+ algorithm; built-in-self test circuitry; deep submicron environment; embedded memory access time; maximum access time; memory access time measurement; Automatic testing; Built-in self-test; Circuit testing; Clocks; Delay; Flip-flops; Logic testing; Semiconductor device measurement; Time measurement; Timing;
Conference_Titel :
Quality Electronic Design, 2001 International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-1025-6
DOI :
10.1109/ISQED.2001.915272
