Title :
Fiber-free Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy
Author :
Farzaneh, M. ; Hudgings, Janice A. ; Ram, Rajeev J.
Author_Institution :
Mount Holyoke Coll., South Hadley
Abstract :
We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
Keywords :
infrared imaging; integrated optics; optical microscopy; optical testing; semiconductor optical amplifiers; superradiance; thermoreflectance; amplified spontaneous emission; cascaded semiconductor optical amplifiers; fiber-free characterization; integrated semiconductor optical amplifiers; photonic integrated circuits; thermoreflectance imaging; thermoreflectance microscopy; Integrated optics; Optical fiber devices; Optical fiber testing; Optical microscopy; Optical surface waves; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453493
