Title :
Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA
Author :
Cochran, Donna J. ; Buchner, Stephen P. ; Sanders, Anthony B. ; LaBel, Kenneth A. ; Carts, Martin A. ; Poivey, Christian F. ; Oldham, Timothy R. ; Ladbury, Raymond L. ; Bryan, Martha V O ; Mackey, Susan
Author_Institution :
MEI Technol. Inc., Greenbelt, MD
Abstract :
Radiation effects testing on a variety of candidate spacecraft electronics to total ionizing dose is studied. Devices tested include digital, analog, mixed signal, and hybrid devices.
Keywords :
integrated circuit testing; radiation hardening (electronics); space vehicle electronics; NASA; analog devices; candidate spacecraft electronics; digital devices; hybrid devices; mixed signal devices; proton-induced damage tests; radiation effects testing; total ionizing dose; Aerospace electronics; Application specific integrated circuits; Electronic equipment testing; FETs; NASA; Performance evaluation; Space technology; Space vehicles; USA Councils; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.9
