DocumentCode
3021768
Title
Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA
Author
Cochran, Donna J. ; Buchner, Stephen P. ; Sanders, Anthony B. ; LaBel, Kenneth A. ; Carts, Martin A. ; Poivey, Christian F. ; Oldham, Timothy R. ; Ladbury, Raymond L. ; Bryan, Martha V O ; Mackey, Susan
Author_Institution
MEI Technol. Inc., Greenbelt, MD
fYear
2008
fDate
14-18 July 2008
Firstpage
5
Lastpage
10
Abstract
Radiation effects testing on a variety of candidate spacecraft electronics to total ionizing dose is studied. Devices tested include digital, analog, mixed signal, and hybrid devices.
Keywords
integrated circuit testing; radiation hardening (electronics); space vehicle electronics; NASA; analog devices; candidate spacecraft electronics; digital devices; hybrid devices; mixed signal devices; proton-induced damage tests; radiation effects testing; total ionizing dose; Aerospace electronics; Application specific integrated circuits; Electronic equipment testing; FETs; NASA; Performance evaluation; Space technology; Space vehicles; USA Councils; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location
Tucson, AZ
Print_ISBN
978-1-4244-2545-7
Type
conf
DOI
10.1109/REDW.2008.9
Filename
4638607
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