• DocumentCode
    3021820
  • Title

    Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

  • Author

    Allen, Gregory R.

  • Author_Institution
    Jet Propulsion Lab. (JPL), Pasadena, CA
  • fYear
    2008
  • fDate
    14-18 July 2008
  • Firstpage
    21
  • Lastpage
    30
  • Abstract
    This paper reports heavy ion and proton induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers a sampling of devices tested over the past eight years.
  • Keywords
    integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); space vehicle electronics; Jet Propulsion Laboratory; NASA spacecraft; device testing; heavy ion effect; microelectronic devices; proton induced effect; single event effects; Cyclotrons; Laboratories; Microelectronics; NASA; Neutrons; Performance evaluation; Propulsion; Protons; Space vehicles; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2008 IEEE
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-4244-2545-7
  • Type

    conf

  • DOI
    10.1109/REDW.2008.11
  • Filename
    4638609
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3021820