Non-scan design for testable data paths using thru operation

We present a new non-scan DFT technique for register-transfer (RT) level data paths. In the technique, we add thru operations to some operational modules to make the data path easily testable. We define a testable measure, weak testability, and consider the problem to make the data path weakly testable with minimum hardware overhead. We also define a measure to estimate the test generation time. Experimental results show the effectiveness of our technique and the proposed measure