Title :
Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory
Author :
Miyahira, Tetsuo F. ; Irom, Farokh
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
This paper reports recent single-event latchup results for a variety of microelectronic devices including an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Keywords :
CMOS integrated circuits; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; CMOS devices; Jet Propulsion Laboratory; NASA spacecraft; microelectronic devices; single-event latchup measurements; Ion beams; Laboratories; NASA; Performance evaluation; Power supplies; Propulsion; Space technology; Space vehicles; Test facilities; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.16
