Title :
Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver
Author :
Koga, R. ; Yu, P. ; George, J.
Author_Institution :
Aerosp. Corp., El Segundo, CA
Abstract :
TLK2711 transceivers belonging to the Class V dice manufactured by Texas Instruments were tested for their sensitivity to radiation. We measured single event effects as well as total ionizing dose effects.
Keywords :
integrated circuit testing; radiation hardening (electronics); transceivers; TI TLK2711 transceiver; Texas Instruments Class V dice; radiation sensitivity; single event effects; total ionizing dose effects; Bit error rate; Clocks; Decoding; Encoding; Manufacturing; Phase locked loops; Protons; Single event upset; Testing; Transceivers;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.19
