A Radiation Hardened High Voltage 16:1 Analog Multiplexer for Space Applications (NGCP3580)

Author

Adams, Dennis A. ; Barnes, Herbert A. ; Fitzpatrick, Michael D. ; Goldstein, Norman P. ; Hand, William L. ; Jackson, William L. ; Koga, Rocky ; Pennock, Michael B. ; Remenapp, Henry J. ; Smith, Joseph T.

Author_Institution

Northrop Grumman Corp., Baltimore, MD

fYear

2008

fDate

14-18 July 2008

Firstpage

82

Lastpage

84

Abstract

Many space systems require the multiplexing of high voltage analog signals around the spacecraft to drive actuators and motors for telemetry control. While considerable resources have supported the radiation hardening of digital electronics, very little has been focused on this critical high voltage analog requirement. To address this issue, Northrop Grumman has developed a radiation hardened high voltage (+/-15 V) 16:1 analog multiplexer for space applications which is described. This device has completed qualification testing with initial production deliveries beginning in January, 2008. Using a combination of process (CMOS/ SOI) and design techniques, this device features latch-up immune operation and 300 krad(Si) total dose hardness. Life testing has been successfully completed (1000 hours at +150 C). The NGCP3580 has been designed to operate with analog inputs as high as 10 V outside of the +/-15 V supply voltage range. A low voltage (+/-5 V) version of this device (NGCL3571) has been in production since 2001.

Keywords

CMOS analogue integrated circuits; integrated circuit testing; life testing; multiplexing equipment; radiation hardening (electronics); silicon-on-insulator; space vehicle electronics; - high voltage analog signals; CMOS process; NGCP3580; Northrop Grumman; SOI process; analog multiplexer; latch-up immune operation; life testing; qualification testing; radiation hardening; space applications; temperature 150 C; time 1000 hour; Actuators; Aerospace electronics; Control systems; Multiplexing; Production; Qualifications; Radiation hardening; Space vehicles; Telemetry; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2008 IEEE

Conference_Location

Tucson, AZ

Print_ISBN

978-1-4244-2545-7

Type

conf

DOI

10.1109/REDW.2008.21

Filename

4638619