Title :
Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations
Author :
Vera, Alonzo ; Llamocca, Daniel ; Fabula, Joe ; Kemp, William ; Marquez, Richard ; Shedd, Walter ; Alexander, David
Author_Institution :
Dept. Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM
Abstract :
The results of ionizing dose rate experiments on XC5VLX50T FPGAs demonstrate the most susceptible upset mechanism of commercial devices and provide insight into the effectiveness of dose rate hardening of nano-scale technology by using epi substrates.
Keywords :
field programmable gate arrays; integrated circuit testing; logic testing; nanotechnology; radiation hardening; system-on-chip; Xilinx Virtex V FPGA; dose rate hardening; epi substrates; field programmable gate array; ionizing dose rate experiments; nanoscale technology; systems-on-a-chip; Circuit testing; Clocks; Field programmable gate arrays; Nanoscale devices; Programmable logic arrays; Prototypes; Shift registers; Sockets; Substrates; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.23
