DocumentCode
3022077
Title
Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations
Author
Vera, Alonzo ; Llamocca, Daniel ; Fabula, Joe ; Kemp, William ; Marquez, Richard ; Shedd, Walter ; Alexander, David
Author_Institution
Dept. Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM
fYear
2008
fDate
14-18 July 2008
Firstpage
90
Lastpage
93
Abstract
The results of ionizing dose rate experiments on XC5VLX50T FPGAs demonstrate the most susceptible upset mechanism of commercial devices and provide insight into the effectiveness of dose rate hardening of nano-scale technology by using epi substrates.
Keywords
field programmable gate arrays; integrated circuit testing; logic testing; nanotechnology; radiation hardening; system-on-chip; Xilinx Virtex V FPGA; dose rate hardening; epi substrates; field programmable gate array; ionizing dose rate experiments; nanoscale technology; systems-on-a-chip; Circuit testing; Clocks; Field programmable gate arrays; Nanoscale devices; Programmable logic arrays; Prototypes; Shift registers; Sockets; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location
Tucson, AZ
Print_ISBN
978-1-4244-2545-7
Type
conf
DOI
10.1109/REDW.2008.23
Filename
4638621
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