Title :
Universal TSC module and its application to the design of TSC circuits
Author :
Pagey, S. ; Al-Khalili, A.J.
Author_Institution :
Concordia Univ., Montreal, Que., Canada
fDate :
Oct. 30 1995-Nov. 1 1995
Abstract :
We present a universal totally self-checking (TSC) module and show that it can be used as a TSC AND, OR, NAND or NOR gate by performing appropriate routing at its input and/or output. We use the two-rail code to encode the signals and consider the multiple unidirectional stuck-at-fault model. We study the utility of such TSC modules in obtaining the TSC realization of a given circuit from its gate level description. We show that it is possible to obtain the SFS realization of a given circuit by replacing each gate in it with its respective TSC version. We discuss the properties that a circuit must have in order to obtain its TSC realization in this manner using the TSC gate.
Keywords :
automatic testing; combinational circuits; design for testability; fault diagnosis; logic design; logic testing; modules; network routing; AND gate; NAND gate; NOR gate; OR gate; TSC circuits design; gate level description; input/output routing; multiple unidirectional stuck-at-fault model; two-rail code; universal TSC module; universal totally self-checking module; Adders; Boolean functions; Circuit faults; Circuit testing; Design methodology; Digital circuits; Electrical fault detection; Fault detection; Rails; Routing;
Conference_Titel :
Signals, Systems and Computers, 1995. 1995 Conference Record of the Twenty-Ninth Asilomar Conference on
Conference_Location :
Pacific Grove, CA, USA
Print_ISBN :
0-8186-7370-2
DOI :
10.1109/ACSSC.1995.540537
