DocumentCode
3022223
Title
Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices
Author
Bogorad, Alexander L. ; Likar, Justin J. ; Moyer, Stephen K. ; Ditzler, Audrey J. ; Doorley, Graham P. ; Herschitz, Roman
Author_Institution
Lockheed Martin Commercial Space Syst., Newton, PA
fYear
2008
fDate
14-18 July 2008
Firstpage
124
Lastpage
130
Abstract
Total dose tests of common devices reveal unexpected dose rate sensitivity. Devices from the same vendor procured to SMD versus military specifications exhibit substantially different dose rate effects. Behavior and critical parameters are compared and discussed.
Keywords
gamma-ray effects; radiation hardening (electronics); space vehicle electronics; candidate spacecraft electronic devices; dose rate sensitivity; gamma ray source; military specifications; total ionizing dose; Aerospace electronics; Operational amplifiers; Pulse amplifiers; Pulse width modulation; Radiation hardening; Semiconductor optical amplifiers; Silicon; Space technology; Space vehicles; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location
Tucson, AZ
Print_ISBN
978-1-4244-2545-7
Type
conf
DOI
10.1109/REDW.2008.29
Filename
4638627
Link To Document