Title :
Electromagnetic interference source identification through fuzzy clustering
Author :
Parrish, E.A. ; Mcdonald, W.E. ; Aylor, J.H. ; Gritton, C.W.K.
Author_Institution :
University of Virginia, Charlottesville, Virginia
Abstract :
A practical solution to the problem of finding the Sup{Min(f1(x), f2(x)}, where f1(x) and f2(x) are N-dimensional fuzzy sets, is presented. A theorem describes an upper bound upon the maximal grade, which is demonstrated to be of use for cluster analysis. Numerical results are presented for an example of electromagnetic interference source identification. Tests indicate that fuzzy clustering, using the result of the theorem, is superior in the sense of minimum achievable error rate to template matching.
Keywords :
Assembly systems; Computer displays; Electric variables measurement; Electromagnetic interference; Fuzzy sets; IEEE members; Measurement standards; Student members; Testing; Upper bound;
Conference_Titel :
Decision and Control including the 16th Symposium on Adaptive Processes and A Special Symposium on Fuzzy Set Theory and Applications, 1977 IEEE Conference on
Conference_Location :
New Orleans, LA, USA
DOI :
10.1109/CDC.1977.271526
