DocumentCode
3022299
Title
TID and SEE Response of Optek Hall Effect Sensors
Author
Sanders, A.B. ; Kim, H.S. ; Phan, A.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD
fYear
2008
fDate
14-18 July 2008
Firstpage
148
Lastpage
151
Abstract
We present TID and SEE testing on the Optek Hall Effect sensors for use in deep space missions, where we investigate the sensors susceptibility to radiation effects as they operate by magnetism.
Keywords
Hall effect transducers; radiation hardening (electronics); space vehicle electronics; Optek Hall effect sensors; SEE testing; TID testing; deep space missions; magnetism; radiation effects; Circuit testing; Hall effect; Hall effect devices; Magnetic devices; Magnetic sensors; Magnets; Mars; NASA; Space technology; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location
Tucson, AZ
Print_ISBN
978-1-4244-2545-7
Type
conf
DOI
10.1109/REDW.2008.33
Filename
4638631
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