Title :
TID and SEE Response of Optek Hall Effect Sensors
Author :
Sanders, A.B. ; Kim, H.S. ; Phan, A.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD
Abstract :
We present TID and SEE testing on the Optek Hall Effect sensors for use in deep space missions, where we investigate the sensors susceptibility to radiation effects as they operate by magnetism.
Keywords :
Hall effect transducers; radiation hardening (electronics); space vehicle electronics; Optek Hall effect sensors; SEE testing; TID testing; deep space missions; magnetism; radiation effects; Circuit testing; Hall effect; Hall effect devices; Magnetic devices; Magnetic sensors; Magnets; Mars; NASA; Space technology; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2008 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-2545-7
DOI :
10.1109/REDW.2008.33
