Title :
An Improved Perceptron Tree Learning Model Based Intrusion Detection Approach
Author :
Xu, Qinzhen ; Bai, Zhimao ; Yang, Luxi
Author_Institution :
Sch. of Inf. Sci. & Eng., Southeast Univ., Nanjing, China
Abstract :
This paper dedicates to develop an improved perceptron tree (PT) learning model based intrusion detection approach. The binary tree structure of a PT enables the model to divide the intrusion detection problem into sub-problems and solve them in decreased complexity in different tree levels. The expert neural networks (ENNs) embedded in the internal nodes can be simplified by limiting the number of inputs and hidden neurons. The potential advantage of a PT is that the trained learning model is actually a ¿gray box¿ since each embedded simplified ENN can be interpreted into explicit rules easily. However, the whole structure of a PT is likely to be high complex, i.e., the trained PT is probably composed of a large number of internal nodes. In this case, the disjunctive description of the learned intrusion detection rules extracted from such PT is too complex to understand. The generalization ability of the detection approach may be depressed as well. In view of this situation, the structure of the trained PT needs to be fine pruned. The experimental results demonstrate that the proposed approach can achieve competitive detection accuracy as well as refined learning model structure.
Keywords :
learning (artificial intelligence); perceptrons; security of data; trees (mathematics); binary tree structure; expert neural networks; gray box; intrusion detection approach; perceptron tree learning model; refined learning model structure; Artificial intelligence; Binary trees; Computational intelligence; Computer security; Decision trees; Information science; Intrusion detection; Machine learning; Neural networks; Neurons; decision tree; intrusion detection; perceptron tree; tree pruning;
Conference_Titel :
Artificial Intelligence and Computational Intelligence, 2009. AICI '09. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3835-8
Electronic_ISBN :
978-0-7695-3816-7
DOI :
10.1109/AICI.2009.176