DocumentCode :
3022649
Title :
State encoding watermarking for field authentication of sequential circuit intellectual property
Author :
Zhang, Li ; Chang, Chip-Hong
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
3013
Lastpage :
3016
Abstract :
This paper proposes a new watermarking scheme for intellectual property (IP) protection of sequential circuits. The method embeds the watermark by encoding the state variables as opposed to modifying the states and edges of state-transition graph (STG) in conventional finite state machine (FSM) watermarking schemes. It has the merits of being applicable to gate-level implementation of sequential circuit without the need to extract the STG; the authorship can be easily authenticated in the field as the watermark is embedded based on testability directed partitioning; and the watermark is hard to be erased by test structure removal and conceivable re-synthesis attacks as it is globally embedded before synthesis and optimization. The scheme has low probability of coincidence and very low logic overhead as evinced by the experimental results on ISCAS benchmark circuits and comparison with the most relevant state-of-the-art IP watermarking scheme.
Keywords :
encoding; finite state machines; graph theory; industrial property; logic gates; sequential circuits; watermarking; ISCAS benchmark circuit; conceivable resynthesis attack; field authentication; finite state machine watermarking scheme; gate-level implementation; intellectual property protection; logic overhead; sequential circuit intellectual property; state encoding watermarking; state variable encoding; state-transition graph; test structure removal; testability directed partitioning; Encoding; Integrated circuit interconnections; Logic gates; Robustness; Sequential circuits; Watermarking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271953
Filename :
6271953
Link To Document :
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