• DocumentCode
    3022851
  • Title

    Static facial expression analysis in tough conditions: Data, evaluation protocol and benchmark

  • Author

    Dhall, Abhinav ; Goecke, Roland ; Lucey, Simon ; Gedeon, Tom

  • Author_Institution
    Res. Sch. of Comput. Sci., Australian Nat. Univ., Canberra, ACT, Australia
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    2106
  • Lastpage
    2112
  • Abstract
    Quality data recorded in varied realistic environments is vital for effective human face related research. Currently available datasets for human facial expression analysis have been generated in highly controlled lab environments. We present a new static facial expression database Static Facial Expressions in the Wild (SFEW) extracted from a temporal facial expressions database Acted Facial Expressions in the Wild (AFEW) [9], which we have extracted from movies. In the past, many robust methods have been reported in the literature. However, these methods have been experimented on different databases or using different protocols within the same databases. The lack of a standard protocol makes it difficult to compare systems and acts as a hindrance in the progress of the field. Therefore, we propose a person independent training and testing protocol for expression recognition as part of the BEFIT workshop. Further, we compare our dataset with the JAFFE and Multi-PIE datasets and provide baseline results.
  • Keywords
    emotion recognition; face recognition; temporal databases; visual databases; AFEW; BEFIT workshop; JAFFE dataset; SFEW; acted facial expressions-in-the-wild; expression recognition; human facial expression analysis; multiPIE dataset; person independent training; static facial expression analysis; static facial expression database; static facial expressions-in-the-wild; temporal facial expressions database; testing protocol; Accuracy; Conferences; Databases; Face; Humans; Motion pictures; Protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4673-0062-9
  • Type

    conf

  • DOI
    10.1109/ICCVW.2011.6130508
  • Filename
    6130508