DocumentCode
3022908
Title
Privacy Weaknesses in Biometric Sketches
Author
Simoens, Koen ; Tuyls, Pim ; Preneel, Bart
Author_Institution
Dept. Electr. Eng., Katholieke Univ. Leuven, Leuven, Belgium
fYear
2009
fDate
17-20 May 2009
Firstpage
188
Lastpage
203
Abstract
The increasing use of biometrics has given rise to new privacy concerns. Biometric encryption systems have been proposed in order to alleviate such concerns: rather than comparing the biometric data directly, a key is derived from these data and subsequently knowledge of this key is proved. One specific application of biometric encryption is the use of biometric sketches: in this case biometric template data are protected with biometric encryption. We address the question whether one can undermine a user´s privacy given access to biometrically encrypted documents, and more in particular, we examine if an attacker can determine whether two documents were encrypted using the same biometric. This is a particular concern for biometric sketches that are deployed in multiple locations: in one scenario the same biometric sketch is deployed everywhere; in a second scenario the same biometric data is protected with two different biometric sketches. We present attacks on template protection schemes that can be described as fuzzy sketches based on error-correcting codes. We demonstrate how to link and reverse protected templates produced by code-offset and bit-permutation sketches.
Keywords
biometrics (access control); cryptography; data privacy; document handling; error correction codes; fuzzy set theory; biometric encryption systems; biometric sketches; biometric template data; biometrically encrypted documents; bit-permutation sketches; code-offset sketches; error-correcting codes; fuzzy sketches; privacy weaknesses; Authentication; Bioinformatics; Biometrics; Cryptography; Data mining; Error correction codes; Privacy; Protection; Security; Turbines;
fLanguage
English
Publisher
ieee
Conference_Titel
Security and Privacy, 2009 30th IEEE Symposium on
Conference_Location
Berkeley, CA
ISSN
1081-6011
Print_ISBN
978-0-7695-3633-0
Type
conf
DOI
10.1109/SP.2009.24
Filename
5207645
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