DocumentCode :
3023456
Title :
A 0.02 nJ self-calibrated 65nm CMOS delay line temperature sensor
Author :
Xie, Shuang ; Ng, Wai Tung
Author_Institution :
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
3126
Lastpage :
3129
Abstract :
This paper presents an area and power efficient delay line based temperature sensor for on-chip monitoring. This sensor can be deployed in large numbers on a microprocessor chip to facilitate advanced thermal and power management techniques. The proposed self-calibration design eliminates the effort associated with two-point calibration commonly found in conventional temperature sensors. In addition, it saves digital decoding power by the use of both tab and counter decoding. Measurement results for a 65nm CMOS design show that the proposed temperature sensor consumes 0.02 nJ energy per conversion. It occupies an active area of 0.002 mm2 and has a resolution of 0.5°C with errors within ±2.0°C over a temperature range from 20 to 80°C.
Keywords :
calibration; integrated circuit design; microprocessor chips; temperature sensors; thermal management (packaging); CMOS design; advanced thermal management techniques; counter decoding; digital decoding power; energy 0.02 nJ; microprocessor chip; on-chip monitoring; power efficient delay line; power management techniques; self-calibrated CMOS delay line temperature sensor; self-calibration design; size 65 nm; temperature 0.5 degC; temperature 20 degC to 80 degC; two-point calibration; CMOS integrated circuits; Decoding; Delay lines; Ring oscillators; Semiconductor device measurement; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271983
Filename :
6271983
Link To Document :
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